In this WhitePaper of Carl W. Gerst, the Cognex Senior Director & Business Unit Manager for ID products you get detailed information about::
- Marking Techniques
- AIM-DPM Standard
- Spezification ISO/IEC 16022
- Spezification ISO/IEC 15415
- Everything about standard Standard Verification Metrics
- Decodability
- Cell Contrast, CC
- Cell Modulation, CM
- Fixed Pattern Damage, FPD
- Grid Non-Uniformity, GNU
- Axial Non-Uniformity, ANU
- Unused Error Correction, UEC
- Minimum Reflectance, MR
- Final Grade
Interested? Please fill in the following form and download the WhitePaper.
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